Constantinou, P., Stock, T. J. Z., Crane, E., Kölker, A., van Loon, M., Li, J., Fearn, S., Bornemann, H., D'Anna, N., Fisher, A. J., Strocov, V. N., Aeppli, G., Curson, N. J., Schofield, S. R.
Soft X-rays enable UCL and Swiss scientists to visualise non-invasively the electronic properties of ultra-thin dopant layers buried within semiconductor wafers. The ability to access this previously hidden information will give a boost to the design and development of quantum-electronic devices.
Constantinou, P. et al. Momentum-Space Imaging of Ultra-Thin Electron Liquids in δ-Doped Silicon. Adv. Sci. 2023, 2302101. https://doi.org/10.1002/advs.202302101