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The IMD houses a wide range of specialist research equipment with unique capabilities to resolve some of the most relevant scientific problems facing researchers today. The IMD characterisation facilities include:
- Scanning Electron Microscopy [Zeiss EVO LS15, Oxford Instruments X-MaxN, Hitachi TMA4000Plus]
- Semiconductor Device Analyzer [Keysight Technologies ltd]
- X-ray Fluorescence [Fischerscope X-Ray Xan 250]
- Nanoidentation [Micro Materials NanoTest Vantage]
- UV/Vis/NIR Spectrophotometer [PerkinElmer Lambda 750S]
- FT-IR, NIR and FIR Spectrometer [PerkinElmer Spectrum Two]
- Surface Profilometer [Bruker Dektak XT]
- Optical Tensiometer [KRUSS, DSA10-Mk2]
- Quartz Crystal Microbalance with Dissipation Monitoring [QSense Analyzer QCM-D]
- X-ray Diffraction [Bruker D8 Advance; AERIS PANalytical Research Edition]
- Raman Spectroscopy [Renishaw inVia™ confocal Raman Microscope; 532 and 611 wavelengths]
- Gas Chromatographer/Mass Spectrometer [PerkinElmer Clarus SQ 8 S]
- Thermogravimetric Analyzer [PerkinElmer TGA 4000]
- Microwave Digestion System [Anton Paar Multiwave 5000]
- Hall Effect Measurement System [Ecopia HMS-3000]
- Four-point Probe System [Ossila T2001A3]
- BET Surface Area and Poer Analyzer [Nova Touch LX2]
- Atomic Force Microscopy [Nanosurf CoreAFM with Isostage 300]
- Thermoelectic Instrument [Linseis LSR-1]
- Light Scattering [Malvern Panalytical Zetasizer Lab]
- Plasma Surface Treatment [Diener electronic Zepto]
- Optical Microscope [ZEISS SteREO Discovery.V12]
- Viscometer
- Potentiostat/Galvanostat [PalmSens4, Gamry Interface 1010E, Gamry Interface 1010T, Metrohm Autolab PGSTAT302N]
- Battery Cyclers [Biologic VMP-3e Multichannel Potentiostat, Neware BTS4000 series, Maccor 4300]
- Solar Simulator [Newport Corporation Oriel® Sol1A™
- Electroluminescence Measurement System [Enli Technology ltd]
- Quantum Efficiency Measurement System [Enlitech QE-R]
- Differential Scanning Calorimentry [PerkinElmer DSC 4000]
- Paios measurement platform (for solar cells/LEDs) [Fluxim AG]