Zeiss Versa 620
This is a 3D X-ray microscope featuring a two-stage magnification technique to uniquely offer resolution at a distance (RaaD) for large sample sizes.
Sample images are initially enlarged through geometric magnification as they are in conventional micro-CTs. In the second stage, a scintillator converts X-rays to visible light, which is then optically magnified. The system can achieve a spatial resolution of 0.7 microns. Four different X-ray lenses are available (0.4x, 4x, 20x and 40x) to achieve a minimum pixel size of 150 nm and a field of view of 300 microns. Phase propagation contrast can be performed and a DEBEN CT5000 5 kN tensile/compression stage can be installed for compression and freeze-thaw cycle experiments.
Key Features
- W 160 kV
- 25 W
- Four magnification lenses (0.4x, 4x, 20x and 40x)
- Filter selection
- Spatial resolution: 0.7 µm
- Propagation phase contrast
- Maximum sample weight: 15 kgScan time: minutes to hours, depending on resolution and sample features
