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UCL Electrochemical Innovation Lab

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Bruker Dimension Icon Atomic Force Microscope (AFM) with Turnkey Glovebox

Overview

The AFM has the advantage of imaging almost any type of surface, including polymers, ceramics, composites, glass, and biological samples. Atomic force microscopy has been employed to characterise sample surface roughness and to form an image of the three-dimensional shape (topography) of a sample surface at a high resolution.

Key Features