Topographic imaging and force-based sensing using AFM

Atomic force microscopy (AFM) is a powerful method for topographic imaging of surfaces with nanometric resolution.

In contrast to other high-resolution techniques, and importantly for in-vivo biological imaging, AFM does not require sample dehydration/labelling. We have applied AFM to study the model organism C. elegans, assessing how its cuticle is affected by mutations in cuticle collagen genes¹ and measuring how the mechanical properties of the organism change with age². We are currently using the technique to test the feasibility of detecting new mechanical signatures in tissue sections to improve diagnosis of cancer³.

¹https://doi.org/10.1016/j.nano.2016.09.006
²https://doi.org/10.1038/s41467-020-14785-0
³https://doi.org/10.1007/978-3-030-32239-7_84