25/10/2015 at 10am: Recent progress in Focused Ion Beam Scanning Electron Microscopy (FIBSEM)

I am pleased to invite you to a brief talk reviewing recent progress in Focussed Ion Beam Scanning Electron Microscopy (FIBSEM) by Eric Hummel from the Carl Zeiss Applications Laboratories Munich at 10 am Friday 25th September - Main Lecture Theatre.

For those of you not aware FIBSEM is an automated technique for obtaining stacks of x,y  images with EM resolution that can work with conventionally processed tissue samples embedded in epoxy or methacrylate resins as well as high pressure frozen material samples milled and imaged below -150@C. Section thickness are now down to 2nm and runs of  3200 plus sections over 53 hours are now routinely possible. The acquisition of large volumes at high resolutions now attainable will transform electron microscopy in the coming years and provide unprecedented insights into the cellular and subcellular organisation of complex tissues. The additional use of tagged proteins ( e.g Apex, miniSog) will further enhance this technology

All welcome!

Host: Peter Munro (peter.munro@ucl.ac.uk)